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AI model extracts hidden semiconductor properties from simple transistor tests in under 1 millisecond

A tandem neural network capable of inferring key physical parameters of semiconductor materials from simple transistor measurements has been developed, as reported by researchers from the Institute of ...
EDN

Using an oscilloscope’s time, frequency, and statistical measurement domains

Multiple domains provide designers and test engineers with complementary views of acquired signals. Oscilloscopes originated as instruments that measure electrical signals in the time domain. The ...
IEEE

Generating Temporal Contact Graphs Using Random Walkers

Abstract: We study human mobility networks through timeseries of contacts between individuals. Our proposed Random Walkers Induced temporal Graph (RWIG) model generates temporal graph sequences based ...
IEEE

ML-Assisted Compact Modeling of Feedback Field-Effect Transistors Using a Gated Recurrent Unit for Circuit Simulation

Abstract: In this paper, we propose a compact model for feedback field-effect transistors (FBFETs), based on a gated recurrent unit (GRU) neural network, enabling fast and accurate circuit-level ...