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The shift to multi-die assemblies is forcing changes in how chips are tested and inspected in order to achieve sufficient yield ramp or respond more quickly to yield excursions.
Claude 4.6 Opus just launched — so I put it head-to-head with Gemini 3 Flash in nine tough tests covering math, logic, coding ...
Abstract: A novel ultrawideband parallel-plate (PP) horn array with an air-filled single-ridge waveguide (SRW) feed network is presented. By designing a wideband double 90°-bend single-to-double (STD) ...
Abstract: This paper presents maximum torque per ampere (MTPA) control using predictive perturbation and observation (P&O) method for dual parallel surface-mounted permanent magnet synchronous motor ...
Kristina Byas is contributor at Investopedia. As a personal finance expert, she has lent her insights and knowledge to numerous financial publications. Her articles have helped readers navigate the ...