Recently, defect detection systems using artificial intelligence (AI) sensor data have been installed in smart factory manufacturing sites. However, when the manufacturing process changes due to ...

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...

Researchers built an AI system that adapts to process changes, maintaining defect detection accuracy and lowering retraining costs in smart factories. (Nanowerk News) Artificial intelligence is ...

Canopus AI has introduced 'Metrospection,' an AI-driven approach designed to improve workflows in wafer and mask metrology.

At the 2025 PDF Solutions Users Conference, CEO John Kibarian delivered a wide-ranging keynote that positioned the semiconductor industry at a pivotal inflection point, one driven by explosive AI ...

Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...