Signal compression is an appealing technique to use in mixed-signal ATE (automated test equipment) systems because it can reduce the cost of test while improving tester performance. Unfortunately, ...
The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
Micropillar compression testing [1] is fast emerging as a viable alternative to nanoindentation, for the measurement of mechanical properties and deformation behavior of small volumes and thin films.
Signal compression is an appealing technique to use in mixed-signal ATE (automated test equipment) systems because it can reduce the cost of test while improving tester performance. Unfortunately, ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results