Cables—the nemesis of compliance, the antennas no one wants—often are the culprits or unwanted stepchildren in EMC testing. Controlling conducted emissions is an inherent problem that requires ...

Electronics design and testing were once two distinct functions where an electronic design was breadboarded and populated ...

The use of redundant logic may increase product reliability. Two of the most costly functions that engineering teams developing electronic products perform are verification and test. On the surface, ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Delivers complete design and validation solution for Low-Power Double Data Rate 6 (LPDDR6) memory in mobile, client computing, and AI applications. Supports JEDEC’s ongoing development of the new ...

Designers relate to Design for Test (DFT) in much the way that small children relate to scary programs on TV: if they cover their eyes with their hands, perhaps it will go away. But every designer ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...