A research team led by Dr. Jeong Min Park of the Nano Materials Research Division at the Korea Institute of Materials Science ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips. Researchers at Cornell University have achieved something chipmakers have ...

A research team led by Dr. Jeong Min Park of the Nano Materials Research Division at the Korea Institute of Materials Science (KIMS) , in ...

Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown ...

Defect-filled lead-halide perovskites rival silicon solar cells because domain walls inside the material separate and guide charges. Researchers visualized these charge-transport networks using a ...

AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical ...

In materials science, defects are irregularities or imperfections in a crystal's atomic structure. While they may sound like flaws, defects are often intentionally introduced to enhance properties ...

Much of modern electronic and computing technology is based on one idea: add chemical impurities, or defects, to semiconductors to change their ability to conduct electricity. These altered materials ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere ...

Researchers have discovered that engineering one-dimensional line defects into certain materials can increase their electrical performance. Materials engineers don't like to see line defects in ...