Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on ICs continues to double every 18 to 24 ...

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.